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ITEK
About ITEK
CEO 인사말
회사개요
연혁
미션 & 비젼
찾아오시는길
공지사항
Test Services
Probe Test
Final Test
Backend
Turnkey Service
Test Solutions
Design-to-Test Solutions
Test Development
Test Vector Conversion
Probe Card and Load Board Design
Test Data Management
Test Data & Yield Analysis
Logic, Mixed Signal & SOC
Analog & Mixed Signal
RF
System Level Test
Policy
품질방침
환경방침
안전방침
윤리방침
보안방침
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IR
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웹 리포트
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ENG
Probe Test
Turnkey Service
Final Test
Test Services
Probe Test
Final Test
Backend
Turnkey Service
Probe Test
ITEK은 경쟁력 있는 Wafer Probe Test Service를 다음과 같이 제공합니다.
- As per Customer’s Device Specifications, Parameters, Vectors and Test Programs
- 6, 8 & 12” Wafers and Bumped Wafers
- Temperature Range : -55 ℃ to +150 ℃
- Class 1K Particle Environment