Design-to-Test Solutions
Test Solutions
Design-To-Test Solutions
ITEK provides complete solutions to reduce customer’s design-to-test, time to market, time to volume production and test cost as below.
- Test Development
- Test Vector Conversion
- Probe Card and Load Board Design
- Test Data Management
- Test Status and Yield Monitor
Test Vector Conversion
ITEK supports vector conversions from ASCII, Verilog VCD, WGL, STIL and other test platforms to various
test platforms ITEK has.
